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Indentation University Webinar Session 20: Statistical Analysis of Measurements
How different must two measurements be, in order for the difference to be statistically significant? This question is certainly not unique to nanoindentation, but the means for answering must be available to its practitioners. In this session, we review the student’s t-test for assessing significant difference in observation sets and its implications for experimental design.

Nov 11, 2020 09:00 AM in Pacific Time (US and Canada)

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Jennifer Hay
Senior Applications Scientist @KLA Instruments
Jennifer Hay is a Senior Applications Scientist at KLA Corporate. Prior to joining KLA, she held similar positions at Nanomechanics, Keysight, Agilent, and MTS Systems Corporation. She received B.S. and M.S. degrees in Mechanical Engineering from the University of Houston. Jennifer has worked in the field of nano-indentation since 1996, advancing standardization while also developing methodology for new applications including thin films, polymers, gels, and biomaterials. Mrs. Hay currently serves as the chair for the MEMS/Nanomechanics technical division of the Society of Experimental Mechanics (SEM). She has authored many journal articles on nano-indentation, including an invited feature series in the SEM journal Experimental Techniques.