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Survey of Methodologies for Resistance Measurements
A review of four-point probe and eddy current resistivity techniques where we will explore the subtleties of each technique and the optimum parameters to use for each technique for various sample types. We will discuss strengths of each technique and where they are different, where are they the same and where are they complementary. We will present discussion on how the techniques can be used together to facilitate a deeper understanding of electrical characteristics of material systems.

Sep 3, 2020 11:00 AM in Pacific Time (US and Canada)

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Speakers

Walt Johnson
Development Engineer @KLA Instruments
Walt Johnson is a Development Engineer on resistivity products for KLA Instruments (a KLA company). Previous to KLA he worked at the IBM Research Labs starting in 1976. There he was an expert in thin film process development, ion implantation and instrument development. He joined KLA in 1985 as a Senior Applications Engineer. Walt has a B.Sc. (Honours) from San Jose State. He has been granted 11 US patents.