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Spectral Reflectance with a microscope, the F40
Going small on the microscope spot size can yield big advantages, such as sample inspection, detailed surface investigation and surface mapping. Join Dr. Jim Elman of Filmetrics for an interactive discussion of the pros and cons of working with small spot sizes. Jim will provide recommendations and cautions for measuring thicker (> 30µm) films, where the numerical aperture of the lens is not always our friend.

May 11, 2021 10:00 AM in Pacific Time (US and Canada)

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