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Reflectance and Transmittance: two are better than one
The simultaneous measurement of reflectance and transmittance can be a powerful tool for optical films. Welcome to the unique world of the F10-RT. Obviously, this will limit us to films on transparent substrates, but it opens up the ability to measure optical constants (particularly k) with confidence. In addition to colorful dielectric films, there will be a discussion of measuring metal films up to hundreds of nms.

Sep 15, 2020 11:00 AM in Pacific Time (US and Canada)

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Speakers

Jim Elman
Applications Manager @KLA Instruments
Jim Elman is an Applications Manager of profiler and thin film products for Filmetrics (a KLA company). Previous to Filmetrics he worked at the Eastman Kodak Research Labs starting in 1978. There he was an expert in spectroscopic ellipsometry, spectral reflectance, adhesion science, and XPS. He joined Filmetrics in 2007 as a Senior Applications Engineer. Jim has a B.Sc. (Honours) from the University of Toronto and a Ph.D. (in polymer science) from the University of Connecticut. He has been granted 24 US patents.